This document details the configuration of Sensor Function Tests (SFT).
SFT Configurations
SFTs are individually configured for each sensor, comparing well-coupled transmitter and receiver components to a baseline survey. The baseline survey may be a factory reference or an initial project survey for comparison.
Demonstration of configuring the SFT for the UT-CA system
Configure the single-transmitter system with well-coupled Tx-Rx measurements in the Z and X directions. In the X-direction, utilize a measurement from a neighboring cube instead of the cube below the test item placement (TIP). To configure this measurement, right-click and select the neighboring cube.
Specific sensor configuration
Note: Test Item Placement (TIP) is indicated by the TIP column.